au.\*:("HAN, Jeon G")
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Recent progress in thin film processing by magnetron sputtering with plasma diagnosticsHAN, Jeon G.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 4, issn 0022-3727, 043001.1-043001.16Article
Role of the composition and type of film-forming species in film structure formationSHAGINYAN, L. R; HAN, Jeon G.Thin solid films. 2004, Vol 458, Num 1-2, pp 186-190, issn 0040-6090, 5 p.Article
Microstructure and optical properties of MgO films synthesized by closed-field unbalanced magnetron sputtering with additional electron emissionNAM, Kyung H; HAN, Jeon G.Surface & coatings technology. 2003, Vol 171, Num 1-3, pp 51-58, issn 0257-8972, 8 p.Article
Spectroscopic study for pulsed DC plasma nitriding of narrow deep holesKIM, Yong M; HAN, Jeon G.Surface & coatings technology. 2003, Vol 171, Num 1-3, pp 205-210, issn 0257-8972, 6 p.Article
Titanium density analysed by optical absorption and emission spectroscopy in a dc magnetron dischargeGAILLARD, M; BRITUN, N; KIM, Yong M et al.Journal of physics. D, Applied physics (Print). 2007, Vol 40, Num 3, pp 809-817, issn 0022-3727, 9 p.Article
Optical absorption spectroscopy of facing targets and conventional magnetron sputtering during process of Al-doped ZnO filmsCHOI, Yoon S; KIM, Jay B; HAN, Jeon G et al.Surface & coatings technology. 2014, Vol 254, pp 371-375, issn 0257-8972, 5 p.Article
The low temperature synthesis of Al doped ZnO films on glass and polymer using pulsed co-magnetron sputtering : H2 effectCHUNG, Yun M; MOON, Chang S; JUNG, Woo S et al.Thin solid films. 2006, Vol 515, Num 2, pp 567-570, issn 0040-6090, 4 p.Conference Paper
Adhesion Properties and Structure of Ion-Beam Modified Polyimide FilmsKIM, Youn J; JIN, Su B; KIM, Sung I et al.Journal of adhesion science and technology. 2011, Vol 25, Num 9, pp 993-1000, issn 0169-4243, 8 p.Article
Super-hydrophobic coatings with nano-size roughness prepared with simple PECVD methodCHOI, Yoon S; LEE, Joon S; JIN, Su B et al.Journal of physics. D, Applied physics (Print). 2013, Vol 46, Num 31, issn 0022-3727, 315501.1-315501.6Article
Nucleation and growth behavior of chromium nitride film deposited on various substrates by magnetron sputteringJUNG, Min J; NAM, Kyung H; JUNG, Yun M et al.Surface & coatings technology. 2003, Vol 171, Num 1-3, pp 59-64, issn 0257-8972, 6 p.Article
A comparative study of microstructure and mechanical properties for CrNx films with various deposition rates by magnetron sputteringNAM, Kyung H; JUNG, Yun M; HAN, Jeon G et al.Surface & coatings technology. 2001, Vol 142-44, pp 1012-1016, issn 0257-8972Conference Paper
The low temperature process design for Al doped ZnO film synthesis on polymerMOON, Chang S; CHUNG, Yun M; JUNG, Woo S et al.Surface & coatings technology. 2007, Vol 201, Num 9-11, pp 5035-5038, issn 0257-8972, 4 p.Conference Paper
High-rate deposition and mechanical properties of SiOX film at low temperature by plasma enhanced chemical vapor deposition with the dual frequencies ultra high frequency and high frequencyJIN, Su B; LEE, Joon S; CHOI, Yoon S et al.Thin solid films. 2011, Vol 519, Num 19, pp 6334-6338, issn 0040-6090, 5 p.Article
Characterization of silicon oxide gas barrier films with controlling to the ion current density (ion flux) by plasma enhanced chemical vapor depositionJIN, Su B; KIM, Youn J; CHOI, Yoon S et al.Thin solid films. 2010, Vol 518, Num 22, pp 6385-6389, issn 0040-6090, 5 p.Article
Properties of argon/oxygen mixture plasmas driven by multiple internal-antenna unitsSETSUHARA, Yuichi; TAKENAKA, Kosuke; EBE, Akinori et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5230-5233, issn 0257-8972, 4 p.Conference Paper
Effect of bilayer period on CrN/Cu nanoscale multilayer thin filmsKIM, Youn J; BYUN, Tae J; LEE, Ho Y et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5508-5511, issn 0257-8972, 4 p.Conference Paper
Structure and mechanical properties of ZrCrAlN nanostructured thin films by closed-field unbalanced magnetron sputteringKIM, Youn J; LEE, Ho Y; KIM, Yong M et al.Surface & coatings technology. 2007, Vol 201, Num 9-11, pp 5547-5551, issn 0257-8972, 5 p.Conference Paper
Scale-up approach for industrial plasma enhanced chemical vapor deposition processes and SiOx thin film technologyJIN, Su B; LEE, Joon S; CHOI, Yoon S et al.Thin solid films. 2013, Vol 547, pp 193-197, issn 0040-6090, 5 p.Conference Paper
12CaO·7Al2O3 doped indium-tin-oxide thin film for transparent cathode in organic light-emitting devicesJUNG, C. H; TAR, P. H; KANG, Y. K et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5421-5424, issn 0257-8972, 4 p.Conference Paper
Characteristics of Nickel-doped Zinc Oxide thin films prepared by sol-gel methodKIM, Kyoung-Tae; KIM, Gwan-Ha; WOO, Jong-Chang et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5650-5653, issn 0257-8972, 4 p.Conference Paper
Deposition of nano-diamond-like carbon films by an atmospheric pressure plasma gun and diagnostic by optical emission spectrum on the processXINCHAO BIAN; QIANG CHEN; YUEFEI ZHANG et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5383-5385, issn 0257-8972, 3 p.Conference Paper
Deposition of superhard nanolayered TiCrAlSiN thin films by cathodic arc plasma depositionSUN KYU KIM; PHAM VAN VINH; JAE WOOK LEE et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5395-5399, issn 0257-8972, 5 p.Conference Paper
Effect of substrate temperature on the electrically conductive stability of sputtered NiO filmsJANG, Wei-Luen; LU, Yang-Ming; HWANG, Weng-Sing et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5444-5447, issn 0257-8972, 4 p.Conference Paper
Effects of Al target power on the mechanical and oxidation resistance of the CrN/AlN multilayer coatingsKIM, B. S; KIM, G. S; LEE, S. Y et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5526-5529, issn 0257-8972, 4 p.Conference Paper
Effects of radio frequency powers on the characteristics of a-C:N/p-Si photovoltaic solar cells prepared by plasma enhanced chemical vapor depositionCHU, Rong-Shian; SHIUE, Sham-Tsong.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5364-5366, issn 0257-8972, 3 p.Conference Paper
